Uncover the intricacies that drive performance.Īttendees can experience the future of data analysis with AMCAD’s state-of-the-art visualization interface, Whiteboard, and see how VISION transforms complex data into actionable insights. Modeling PAs and Beamformers: Join us for a demonstration as we model Power Amplifiers (PAs) and Beamformers, breaking down their functionality and impact within RF systems. See firsthand how this powerful platform is reshaping RF system design and simulation. VISION 2.3 - Circuit and System Modeling and Simulationĭive deep into the world of VISION, where behavioral modeling meets simulation, and complexity meets clarity. The measurements are then used in VISION to extract a model that can be used to simulate an Active Antenna. The data is then analyzed with the Whiteboard, using the filters and control tools to identify the important results. The ATE system is controlled through the IQSTAR platform for complete calibration and characterization. At the same time, the test instruments collect the data. The measurement system integrates AMCAD hardware to monitor the measurement conditions and ensure a safe environment for the DUT using very fast e-fuses. All the equipment will be controlled using IVCAD software.ĪMCAD will demonstrate a turnkey Automated Test Equipment (ATE) to characterize Beamformers. Teaming up with Maury Microwave and MPI, AMCAD will demonstrate on-wafer measurements using a Nano5G tuner integrated with the AMCAD Pulsed IV System AM3200 on an MPI probe station. This solution uses a VNA-based Load Pull and our AMCAD pulse IV systems to guarantee the perfect alignment of the small-signal and large-signal data used for model extraction work. These measurements are essential for efficient compact modeling extraction and are dedicated to advanced RF power amplifier design work. ![]() A variable pre-RF pulse shapes the I-V network to obtain a dynamic evolution of the charge trapping state, obtaining a more representative description of the IV curves when the transistor is used in large signal conditions. ![]() To this end, AMCAD has developed a new modeling methodology for model extraction. Our customers' current need is to speed up RF transistor model extraction. Depending on the project, it can represent several months of work and budgets of tens or hundreds of dollars. These tests are dedicated to transistor compact modeling.Įxtracting an RF transistor compact model can be time-consuming and costly. This demonstration focuses on an innovative dual-pulse technique combining a pre-RF pulse and pulse-IV measurements for RF component characterization. IVCAD 3.10.2 - Pre-RF Pulse IV Measurements for Enhanced Transistor Compact Modeling The bench is controlled using IQSTAR software from AMCAD Engineering, which allows a comprehensive characterization of the RF power amplifier in an environment close to the final implementation of the radio unit. In collaboration with AMD, this demonstration uses the latest Zyn UltraScale+™ Zynq RFSoC DFE and AMD's latest DPD and CFR IP.
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